Company Filing History:
Years Active: 2018
Title: Innovations by Brandon K Eames
Introduction
Brandon K Eames is an accomplished inventor based in Albuquerque, NM. He has made significant contributions to the field of supply chain analytics through his innovative patent. His work focuses on identifying and mitigating risks within supply chains, showcasing his expertise in technology and risk management.
Latest Patents
Brandon holds a patent titled "Framework and methodology for supply chain lifecycle analytics." This patent presents various technologies aimed at identifying and mitigating risks and attacks on a supply chain. The invention generates a computer-implemented representation of a supply chain, comprising nodes (locations) and edges (objects, information). It defines risks and attack vectors for the various nodes and edges, allowing for the determination of difficulty and consequence pairs. The patent also outlines how mitigations can be generated to enhance the difficulty of attacks and reduce their consequences, taking into account constraints such as cost and time. A context-free grammar is utilized to identify potential attacks in the supply chain, and risks are ranked to prioritize mitigation efforts.
Career Highlights
Brandon is currently employed at National Technology & Engineering Solutions of Sandia, LLC. His role involves leveraging his expertise in supply chain analytics to develop innovative solutions that address complex challenges in the field. His work has positioned him as a key contributor to advancements in supply chain risk management.
Collaborations
Brandon collaborates with talented professionals such as Jason Hamlet and Gio K Kao. Together, they work on projects that enhance the understanding and management of supply chain risks.
Conclusion
Brandon K Eames is a notable inventor whose work in supply chain lifecycle analytics has the potential to transform how organizations manage risks. His innovative approach and dedication to technology continue to make a significant impact in the field.