Company Filing History:
Years Active: 2009-2016
Title: Bernd Geck: Innovator in Scattering Parameter Measurement
Introduction
Bernd Geck is a notable inventor based in Hannover, Germany. He has made significant contributions to the field of electrical measurement technology, holding a total of 6 patents. His work primarily focuses on methods and systems for determining scattering parameters, which are crucial in various electronic applications.
Latest Patents
One of Bernd Geck's latest patents is a method of determining scattering parameters using a measurement arrangement that includes a calibration substrate and an electronic circuit. This innovative method involves a calibration substrate with at least one calibration standard featuring multiple electrical connection points, each corresponding to a measurement gate of a vector network analyzer. The design includes a switch that allows for electrical connections to be established between different contacts, enhancing the accuracy of measurements.
Another significant patent is a measuring system designed for determining scatter parameters of an electrical measurement object on a substrate. This system comprises a measuring machine with at least one measuring channel and a measuring probe that can connect to an electrical signal line. The system is equipped with a positioning device that utilizes sensors to detect the position of the measuring probe, ensuring precise measurements.
Career Highlights
Throughout his career, Bernd Geck has worked with prominent companies such as Rosenberger Hochfrequenztechnik GmbH & Co. KG and Eastman Kodak Company. His experience in these organizations has contributed to his expertise in the field of electrical measurements and innovations.
Collaborations
Bernd has collaborated with notable colleagues, including Thomas Zelder and Knut Behnke. These partnerships have likely fostered a creative environment that has led to advancements in their respective fields.
Conclusion
In summary, Bernd Geck is a distinguished inventor whose work in scattering parameter measurement has made a significant impact in the field of electrical engineering. His innovative patents and collaborations reflect his dedication to advancing technology.