Company Filing History:
Years Active: 1999
Title: Bascom S Dearer, Jr: Innovator in Scanning Probe Microscopy
Introduction
Bascom S Dearer, Jr. is a notable inventor based in Charlottesville, VA (US). He has made significant contributions to the field of scanning probe microscopy through his innovative patent. His work focuses on enhancing the precision of tip-to-sample distance control, which is crucial for various applications in nanotechnology.
Latest Patents
Bascom S Dearer, Jr. holds a patent titled "Nanometer distance regulation using electromechanical power dissipation." This patent describes a convenient, non-optical method for scanning probe microscopy tip-to-sample distance control based on the impedance change in a shear-force dither piezo. The method involves determining the tip-sample distance by measuring the impedance change in a shear-force piezo-member. A Wheatstone type bridge can be utilized to regulate the tip-sample separation. Alternatively, an electrical bridge, having an output, regulates the tip-sample separation relative to the bridge output by driving the piezo/tip with a sine wave and combining said sine wave with a phase-referenced wave of equal amplitude at a 180-degree phase shift. The electronic bridge detects impedance changes of about -100 dB across loads with impedance phases between -90 degrees to +90. Power dissipation is determined by measuring changes in electric impedance that a dither piezo presents to an oscillator. The non-optical method of determining probe-to-sample distance of an oscillating scanning probe consists of changing the probe-to-sample distance of an oscillating scanning probe. The changes in the electro-mechanical power dissipation of the oscillating probe are then measured.
Career Highlights
Bascom S Dearer, Jr. is associated with the Uva Patent Foundation, where he continues to contribute to advancements in technology and innovation. His work has garnered attention for its practical applications in scientific research and development.
Collaborations
He has collaborated with notable colleagues such as Julia W Hsu and Mark Lee, further enhancing the impact of his work in the field.
Conclusion
Bascom S Dearer, Jr. is a distinguished inventor whose contributions to scanning probe microscopy have paved the way for advancements in nanotechnology. His innovative approach to distance regulation using electromechanical power dissipation showcases his commitment to enhancing scientific research.