Company Filing History:
Years Active: 1998
Title: Bart A Stuchell: Innovator in X-ray Analysis Technology
Introduction
Bart A Stuchell is a notable inventor based in Alliance, OH (US). He has made significant contributions to the field of X-ray analysis technology, holding a total of 2 patents. His innovative work has advanced the methods used for analyzing pulverized coal and measuring chromium content in metal layers.
Latest Patents
One of Stuchell's latest patents is focused on X-ray fluorescence analysis of pulverized coal. This invention features an on-line X-ray fluorescent monitoring system that utilizes a probe with an X-ray transmitter and a fluorescent X-ray detector. The system is designed to monitor coal feed lines, allowing for real-time analysis of pulverized coal as it travels through the feed line. The probe collects fluorescence data from the coal, which is then transmitted for analysis. Additionally, a pressurized air tube is incorporated to clear accumulated coal, ensuring continuous sampling.
Another significant patent by Stuchell is a measurement system for determining chromium content in chromized layers. This method involves cutting a sample of a metal member to progressively reduce its wall thickness. An X-ray analyzing system is then moved past the sample to collect data on the analyte content, providing valuable insights into the material's properties.
Career Highlights
Throughout his career, Bart A Stuchell has worked with prominent companies such as McDermott Technology, Inc. and The Babcock & Wilcox Company. His experience in these organizations has contributed to his expertise in the field of X-ray analysis and measurement technologies.
Collaborations
Stuchell has collaborated with notable professionals in his field, including Dennis J Connolly and Richard W Dye. These collaborations have likely enriched his work and contributed to the development of his innovative patents.
Conclusion
Bart A Stuchell's contributions to X-ray analysis technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in material analysis, making him a significant figure in his field.