Company Filing History:
Years Active: 2007-2008
Title: Barry O'Connell: Innovator in Metal-Insulator-Metal Capacitor Testing
Introduction
Barry O'Connell is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of semiconductor technology, particularly in the testing of metal-insulator-metal (MIM) capacitor structures. With a total of 2 patents, O'Connell's work has advanced the methodologies used in high-temperature testing of these critical components.
Latest Patents
O'Connell's latest patents focus on innovative methods for testing MIM capacitor structures under high temperatures at the wafer level. The first patent describes a test methodology that involves forming a resistor on a dielectric isolation material in a semiconductor substrate. A MIM capacitor is then formed over this resistor, separated by dielectric material. A metal thermometer, made from the same material as the capacitor plates, is placed above the resistor. By forcing high current through the resistor, both the thermometer and the MIM capacitor heat up. The change in resistance of the thermometer is monitored, allowing for temperature conversion using the known temperature coefficient of resistance (TCR) of the metal.
The second patent elaborates on a similar test structure and methodology for MIM capacitors under high temperatures. It includes the same components and principles as the first patent, emphasizing the importance of accurate temperature measurement in semiconductor testing.
Career Highlights
Barry O'Connell is currently employed at National Semiconductor Corporation, where he continues to innovate in the field of semiconductor technology. His work has been instrumental in enhancing the reliability and performance of MIM capacitors, which are essential in various electronic applications.
Collaborations
O'Connell has collaborated with notable colleagues such as Prasad Chaparala and Jonggook Kim. Their combined expertise has contributed to the successful development of advanced testing methodologies in the semiconductor industry.
Conclusion
Barry O'Connell's contributions to the field of semiconductor technology, particularly in the testing of MIM capacitors, highlight his innovative spirit and dedication to advancing the industry. His patents reflect a commitment to improving testing methodologies, ensuring the reliability of electronic components.