Company Filing History:
Years Active: 2001
Title: The Innovations of Barney Doyle
Introduction
Barney Doyle is an accomplished inventor based in Albuquerque, NM (US). He is known for his significant contributions to the field of microscopy, particularly through his innovative patent that enhances surface sensitivity in measurements.
Latest Patents
Barney Doyle holds a patent for a highly charged ion based time-of-flight emission microscope. This advanced instrument improves the surface sensitivity of static SIMS measurements due to the higher ionization probability of highly charged ions. The design involves producing slow, highly charged ions in an electron beam ion trap, which are then directed to the sample surface. The sputtered secondary ions and electrons are collected through a specially designed objective lens to a microchannel plate detector. This microscope allows for high surface sensitivity of 10 atoms/cm², high spatial resolution of 100 nm, and provides valuable chemical structural information due to the high molecular ion yields. The high secondary ion yield enables coincidence counting, enhancing the determination of chemical and topological structures while correlating specific molecular species.
Career Highlights
Barney Doyle is affiliated with the University of California, where he continues to push the boundaries of scientific research and innovation. His work has significantly impacted the field of microscopy, making it possible to achieve unprecedented levels of detail and accuracy in surface analysis.
Collaborations
Some of his notable coworkers include Alan V Barnes and Thomas Schenkel, who have contributed to the advancements in the technologies he has developed.
Conclusion
Barney Doyle's innovative work in microscopy exemplifies the importance of advancements in scientific research. His patented technology not only enhances measurement capabilities but also opens new avenues for exploration in material science and chemistry.