Bahram Pouya

Title: The Innovative Contributions of Bahram Pouya

Introduction

Bahram Pouya is a notable inventor based in Austin, TX (US). He has made significant contributions to the field of technology, particularly in the area of test access mechanisms for integrated circuits. His work has implications for improving the efficiency and effectiveness of built-in self-test (BIST) circuits.

Latest Patents

Bahram Pouya holds a patent titled "Test access mechanism for supporting a configurable built-in self-test circuit and method thereof." This innovative patent describes a configurable test access mechanism that includes a sliced input wrapper, output wrapper, and scan configuration wrapper connected to a circuit under test. The input wrapper integrates a pseudo-random pattern generator (PRPG) function into a scan test structure without compromising speed and power requirements. Additionally, the output wrapper incorporates a multiple input signature register (MISR) functionality for enhanced testing capabilities. The use of existing scan structures to implement the PRPG and MISR functions results in significant savings in circuitry. Furthermore, the variability of test polynomials can be easily programmed by the user.

Career Highlights

Bahram Pouya is associated with Motorola Corporation, where he has contributed to various projects and innovations. His work has been instrumental in advancing the technology used in testing integrated circuits.

Collaborations

Bahram has collaborated with notable colleagues, including Alfred Larry Crouch and Gregory Dean Young. Their combined expertise has fostered advancements in the field of circuit testing and design.

Conclusion

Bahram Pouya's contributions to the field of technology, particularly through his patent on test access mechanisms, highlight his innovative spirit and dedication to improving circuit testing methodologies. His work continues to influence the industry and pave the way for future advancements.