Baek Young Lee

Title: Innovations by Baek Young Lee

Introduction

Baek Young Lee is a prominent inventor based in Seoul, South Korea. He has made significant contributions to the field of technology, particularly in the area of defect detection on wafers. With a total of two patents to his name, his work showcases innovative approaches to complex problems in the semiconductor industry.

Latest Patents

Baek Young Lee's latest patents include a method and apparatus for detecting defect patterns on wafers based on unsupervised learning. This method enables clustering for newly generated patterns and is robust against noise, eliminating the need for tagging training data. The invention accurately removes noise using three-dimensional stacked spatial auto-correlation. It employs multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values as learning features for clustering model generation. This makes the method resilient to noise, rotation, and fine unusual shapes. Additionally, the resulting clusters from this clustering process are classified into multi-level clusters, allowing for stochastic automatic evaluation of normal and defect clusters using measurement data without labels.

Career Highlights

Baek Young Lee is currently employed at Samsung SDS Co., Ltd., where he continues to develop innovative solutions in technology. His work has been instrumental in advancing methods for defect detection, which is crucial for maintaining quality in semiconductor manufacturing.

Collaborations

He has collaborated with notable colleagues, including Min Sik Chu and Seong Mi Park, contributing to a dynamic and innovative work environment.

Conclusion

Baek Young Lee's contributions to the field of technology, particularly through his patents, highlight his role as a leading inventor in the industry. His innovative methods for defect detection are paving the way for advancements in semiconductor technology.