Ayana Muraki

Title: Ayana Muraki: Innovator in Charged Particle Beam Technology

Introduction

Ayana Muraki is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of charged particle beam technology, holding a total of 4 patents. Her work focuses on enhancing automated processing methods, which are crucial for various applications in science and industry.

Latest Patents

Among her latest patents is a "Charged Particle Beam Apparatus and Control Method Thereof," which introduces an automated processing system. This apparatus includes an image identity degree determination unit that assesses the identity degree between a processing cross-section image obtained through a scanning electron microscope and a previously registered criterion image. Additionally, she has developed a "Charged Particle Beam Apparatus" designed for fast automated micro-sampling. This innovative apparatus is capable of automatically fabricating a sample piece from a larger sample, utilizing a charged particle beam irradiation optical system and a machine learning model for precise position control.

Career Highlights

Ayana Muraki is currently employed at Hitachi High-Tech Science Corporation, where she continues to push the boundaries of technology in her field. Her expertise in charged particle beam systems has positioned her as a key player in advancing automated processing techniques.

Collaborations

She collaborates with talented coworkers, including Tatsuya Asahata and Atsushi Uemoto, contributing to a dynamic team focused on innovation and research.

Conclusion

Ayana Muraki's work in charged particle beam technology exemplifies her commitment to innovation and excellence. Her patents reflect her dedication to improving automated processing methods, making her a significant figure in her field.