South Euclid, OH, United States of America

Avraham C Goldman


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: Avraham C Goldman: Innovator in Contactless Measurement Technology

Introduction

Avraham C Goldman is a notable inventor based in South Euclid, Ohio. He has made significant contributions to the field of measurement technology, particularly in the automotive sector. His innovative approach to gauging the thickness of contoured objects has led to the development of a unique patent.

Latest Patents

Goldman's most recent patent is titled "System and method for contactlessly gauging the thickness of a contoured object." This invention provides a system for visually measuring the cross-sectional thickness of light-reflective objects, such as vehicle wheels, which have multiple curved surfaces. The system utilizes means for transmitting a line of light onto each curved surface and sensing the reflected light to produce signals that represent the linear profile of each surface. This allows for accurate calculations of the object's thickness at various points. The system also includes features for supporting and rotating the object to measure multiple cross-sectional thicknesses effectively.

Career Highlights

Avraham C Goldman is associated with the Aluminum Company of America, where he applies his expertise in measurement technology. His work has been instrumental in enhancing the precision of inspections for vehicle wheels, ensuring they meet dimensional specifications.

Collaborations

Goldman has collaborated with notable colleagues, including Louis G Willoughby, Jr. and Donald G Jordan. Their combined efforts have contributed to advancements in measurement techniques and technologies.

Conclusion

Avraham C Goldman stands out as an innovative inventor whose work in contactless measurement technology has the potential to impact various industries. His contributions continue to pave the way for advancements in precision measurement.

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