Bengaluru, India

Avil Saunshi

USPTO Granted Patents = 1 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Avil Saunshi: Innovator in Leaf Age Estimation Technology

Introduction

Avil Saunshi is a notable inventor based in Bengaluru, India. He has made significant contributions to the field of plant science through his innovative patent. His work focuses on improving the methods used to estimate the age of leaves, which is crucial for understanding various plant characteristics.

Latest Patents

Avil Saunshi holds a patent titled "Method and system for leaf age estimation based on morphological features extracted from segmented leaves." This patent addresses the traditional challenges of leaf age estimation, which typically requires a leaf to be plucked and imaged in a controlled environment. His method allows for the estimation of leaf age using images captured in uncontrolled environments, thus making the process more efficient and accessible. The technique involves segmenting images to identify leaf veins, which helps in obtaining full leaves and identifying associated plant species. The morphological features extracted are then used in a pre-trained multivariable linear regression model to estimate the age of each leaf. This innovation has applications in assessing various plant characteristics, including photosynthetic rate, transpiration, nitrogen content, and overall plant health.

Career Highlights

Avil Saunshi is currently employed at Tata Consultancy Services Limited, where he continues to work on innovative solutions in the field of plant science. His expertise and dedication to research have positioned him as a valuable asset in his organization.

Collaborations

Some of Avil's coworkers include Prakruti Vinodchandra Bhatt and Sanat Sarangi. Their collaborative efforts contribute to the advancement of research and innovation within their field.

Conclusion

Avil Saunshi's work in leaf age estimation represents a significant advancement in plant science. His innovative approach not only simplifies the process of leaf age estimation but also enhances our understanding of plant health and characteristics. His contributions are paving the way for future research and applications in this important area.

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