Austin C Dumbri

Title: The Innovations of Austin C. Dumbri

Introduction

Austin C. Dumbri is a notable inventor based in Easton, PA (US), recognized for his contributions to the field of integrated circuit testing. With a total of 6 patents to his name, he has made significant advancements in technology that enhance the efficiency and effectiveness of electronic components.

Latest Patents

Among his latest patents is the innovative "Chip-on-chip testing using BIST." This invention involves constructing an auxiliary Built-In Self-Test (BIST) circuit in a primary chip, allowing for the testing of a secondary chip without the need for a separate BIST circuit. This method provides direct test access to the secondary chip, streamlining the testing process. Another significant patent is the "Column decoder circuit for use with memory using multiplexed row and column addresses." This design improves access time and reduces power dissipation by deactivating the column decoder during row address time, thus enhancing overall memory performance.

Career Highlights

Austin has had a distinguished career, working with prestigious organizations such as AT&T Bell Laboratories and Agere Systems. His work in these companies has contributed to the development of cutting-edge technologies in the field of electronics.

Collaborations

Throughout his career, Austin has collaborated with notable colleagues, including Frank J. Procyk and Walter Rosenzweig. These partnerships have fostered innovation and have been instrumental in the success of various projects.

Conclusion

Austin C. Dumbri's contributions to the field of integrated circuits and testing methodologies have made a lasting impact on technology. His innovative patents and collaborations highlight his role as a significant figure in the advancement of electronic engineering.