Company Filing History:
Years Active: 2003-2011
Title: Arthur W. Mario: Innovator in X-ray Inspection Technology
Introduction
Arthur W. Mario is a notable inventor based in Hopatcong, NJ (US). He has made significant contributions to the field of X-ray inspection technology, holding a total of 3 patents. His work focuses on enhancing the efficiency and effectiveness of detecting contraband through advanced imaging techniques.
Latest Patents
Mario's latest patents include a "Scanning X-ray inspection system using scintillation detection with simultaneous counting and integrating modes." This innovative system transmits X-ray radiation through and scatters it from objects under inspection to detect weapons, narcotics, explosives, or other contraband. The use of relatively fast scintillators allows for faster X-ray detection efficiency and significantly improved image resolution. The system displays scatter and transmission images of the object, with at least one image colorized according to the effective atomic number of the object's constituents. Additionally, soft switching between photon-counting and photon integration modes reduces noise and significantly enhances overall image quality.
Another notable patent is the "Tomographic scanning X-ray inspection system using transmitted and Compton scattered radiation." Similar to his previous work, this system also aims to detect contraband by transmitting and scattering X-ray radiation. The design is improved through the use of optically adiabatic scintillators, and the switching between photon-counting and photon integration modes further reduces noise and enhances image quality.
Career Highlights
Arthur W. Mario is currently associated with Control Screening, LLC, where he continues to develop innovative solutions in X-ray inspection technology. His expertise and dedication to improving detection systems have positioned him as a key figure in this specialized field.
Collaborations
Mario has collaborated with notable colleagues, including Scott David Kravis and Karl E. Geisel. Their combined efforts contribute to the advancement of technology in the realm of X-ray inspection.
Conclusion
Arthur W. Mario's contributions to X-ray inspection technology through his innovative patents demonstrate his commitment to enhancing safety and security measures. His work continues to influence the industry and improve detection capabilities.