Brookfield, CT, United States of America

Arthur E Falls


Average Co-Inventor Count = 6.4

ph-index = 3

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 1989-1997

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3 patents (USPTO):Explore Patents

Title: Arthur E Falls: Innovator in High Density Testing Technologies

Introduction

Arthur E Falls is a notable inventor based in Brookfield, CT (US). He has made significant contributions to the field of testing technologies, particularly in high density passive boards and substrates. With a total of 3 patents to his name, Falls has demonstrated a commitment to innovation and excellence in his work.

Latest Patents

One of Falls' latest patents focuses on a system and method for testing and fault isolation of high density passive boards. This apparatus allows for the performance of testing and fault isolation using a small number of moving probes. It enables simultaneous network resistance and network capacitance measurements, thereby minimizing test time by eliminating the need for electrical switching and excessive probe movement. Additionally, the patent describes how simultaneous network capacitance and network leakage measurements can be achieved using phase-sensitive detection. The dual-frequency measurement techniques allow for the measurement of both capacitance and resistance values of leakage paths, enhancing defect detection capabilities.

Career Highlights

Arthur E Falls has had a distinguished career, working at the International Business Machines Corporation (IBM). His work has been instrumental in advancing testing technologies, particularly in the realm of circuit board networks. Falls' innovative approaches have contributed to improved efficiency and accuracy in testing processes.

Collaborations

Falls has collaborated with notable coworkers, including Arnold Halperin and John D Mackay. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Arthur E Falls is a prominent inventor whose work in high density testing technologies has made a significant impact in the field. His patents reflect a deep understanding of the complexities involved in testing and fault isolation, showcasing his dedication to advancing technology.

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