Arnold E Barish

Title: The Innovations of Arnold E. Barish

Introduction

Arnold E. Barish is a notable inventor based in Pleasant Valley, NY (US). He has made significant contributions to the field of semiconductor manufacturing and differential current testing. With a total of 2 patents, his work has had a considerable impact on technology.

Latest Patents

Arnold E. Barish's latest patents include a "Defect monitor for semiconductor manufacturing capable of performing analog resistance measurements." This invention provides a mechanism to address a structure under test and identify points of failure. It utilizes test open and test short lines to indicate the status of the structure. The test circuit operates in both digital and analog modes, offering valuable resistance measurements relative to a programmable load.

Another significant patent is the "Method and apparatus for detecting faults in differential current." This circuit tests a differential current switching logic circuit, employing transistors to sense potential differences between output signals. The design allows for precise fault detection, enhancing the reliability of electronic circuits.

Career Highlights

Arnold E. Barish is associated with International Business Machines Corporation (IBM), where he has contributed to various innovative projects. His expertise in semiconductor technology and circuit design has positioned him as a key figure in his field.

Collaborations

Throughout his career, Arnold has collaborated with notable coworkers such as David A. Kiesling and Mark D. Mayo. These partnerships have fostered a creative environment that has led to groundbreaking advancements in technology.

Conclusion

Arnold E. Barish's contributions to the field of technology through his patents and collaborations highlight his role as an influential inventor. His work continues to shape the future of semiconductor manufacturing and circuit testing.