Arkadeep Banerjee

Introduction

Arkadeep Banerjee is a noteworthy inventor based in Bengaluru, India. He has made significant contributions to the field of data integrity through his innovative approaches to detecting data entry errors.

Latest Patents

Arkadeep holds one patent that showcases his ingenuity. The patent is titled "Likelihood Ratio Test-Based Approach for Detecting Data Entry Errors." This invention involves sophisticated techniques designed to identify errors in data fields. The method includes receiving user input for a data field, generating histogram-based approximations of kernel density estimates derived from both valid and invalid data, and determining the likelihood of new values being valid or invalid. This is achieved by computing a likelihood ratio test statistic, which classifies the new values based on a pre-set threshold.

Career Highlights

Arkadeep is currently associated with Intuit, Inc., where he leverages his expertise to enhance the accuracy and reliability of data processing systems. His work contributes to improving financial software and services, ensuring that users receive accurate information for their financial decisions.

Collaborations

Throughout his career, Arkadeep has worked in collaboration with various researchers and professionals at Intuit, Inc., engaging in projects that aim to innovate data management and error detection systems.

Conclusion

Arkadeep Banerjee stands out in the realm of data integrity with his innovative approaches and dedication to improving technological solutions. His patent on detecting data entry errors is a testament to his capabilities in enhancing software reliability and functionality in the tech industry.