Company Filing History:
2 out of 2,010 
1 out of 1 Years Active: 2022-2025
Title: Anuj Jawahar Kapadia: Innovator in X-ray Imaging Technologies
Introduction
Anuj Jawahar Kapadia is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of X-ray imaging technologies. With a total of 2 patents, his work focuses on enhancing the capabilities of imaging systems for better material discrimination and analysis.
Latest Patents
Anuj's latest patents include a method for capturing small-angle scatter over wide fields of view. This innovative method estimates material coherent scatter form factors for voxels within a scan object by exposing a series of slices to an X-ray fan beam within a coherent scatter scanner. The process involves capturing coherent scatter data at multiple X-ray detector modules, which are limited to a small-angle field of view. By combining this data, Anuj generates an aggregated collection of estimated material coherent scatter form factors for individual voxels. This collection is then used to estimate material types for model items within the scan object.
Another significant patent is focused on systems and methods for tissue discrimination via multi-modality coded aperture X-ray imaging. This invention utilizes coded X-ray beams to analyze transmission and scatter signals, determining tissue properties effectively.
Career Highlights
Anuj has worked with prestigious institutions such as Duke University and Quadridox, Inc. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking research in imaging technologies.
Collaborations
Anuj has collaborated with notable professionals in his field, including Joel Alter Greenberg and Michael E Gehm. These collaborations have further enriched his work and expanded the impact of his inventions.
Conclusion
Anuj Jawahar Kapadia is a distinguished inventor whose work in X-ray imaging technologies has the potential to revolutionize material analysis and tissue discrimination. His innovative patents reflect his commitment to advancing the field and improving imaging techniques.