Anthony S Polson

Title: Anthony S Polson: Innovator in Integrated Circuit Testing

Introduction

Anthony S Polson is a notable inventor based in Jericho, Vermont, known for his contributions to the field of integrated circuit testing. He holds a patent for a method that enhances the testing process of integrated circuits at functional clock frequency. His work is significant in ensuring the reliability and efficiency of electronic devices.

Latest Patents

Anthony S Polson has been granted a patent for "Functional frequency testing of integrated circuits." This patent describes a method and circuits for testing an integrated circuit at functional clock frequency. The innovation involves a test controller that generates control signals to ensure proper latching of test patterns in scan chains at tester frequency. It also facilitates the propagation of the test pattern through the logic circuits being tested at functional clock frequency.

Career Highlights

Polson is associated with International Business Machines Corporation (IBM), where he applies his expertise in integrated circuit technology. His work at IBM has allowed him to contribute to advancements in electronic testing methodologies, making a significant impact in the industry.

Collaborations

Throughout his career, Anthony has collaborated with notable colleagues, including Gary Douglas Grise and Steven Frederick Oakland. These collaborations have fostered innovation and development in the field of integrated circuits.

Conclusion

Anthony S Polson's contributions to integrated circuit testing exemplify the importance of innovation in technology. His patent and work at IBM highlight his role as a key figure in advancing electronic testing methods.