Company Filing History:
Years Active: 2020
Title: Innovations by Anna E Dorfi in Scanning Probe Microscopy
Introduction
Anna E Dorfi is an accomplished inventor based in New York, NY (US). She has made significant contributions to the field of scanning probe microscopy, particularly through her innovative patent that enhances imaging techniques.
Latest Patents
Anna E Dorfi holds a patent for "Non-local scanning probes for scanning probe microscopy." This system is designed to perform scanning electrochemical microscopy using non-local continuous line probes. The continuous line probes consist of an insulating probe substrate, an insulating layer, and a conductive band electrode. The system includes a sample stage that positions a sample substrate for imaging, allowing contact with the insulating probe substrate at a specific angle. The continuous line probe is translated across the sample substrate, and changes in the signal generated at the probe indicate the presence of features on the substrate. Multiple scans are conducted at different angles, and the results are combined and analyzed to produce an image of the sample substrate through compressed sensing reconstruction. This innovative approach yields images with comparable resolution to conventional methods but requires less scan time and simpler scanning hardware.
Career Highlights
Anna E Dorfi is affiliated with Columbia University, where she continues her research and development in advanced microscopy techniques. Her work has garnered attention for its potential applications in various scientific fields.
Collaborations
Anna has collaborated with notable colleagues, including Daniel Vincent Esposito and Glen Daniel O'Neil, contributing to the advancement of technology in her field.
Conclusion
Anna E Dorfi's innovative work in scanning probe microscopy exemplifies the impact of her research on imaging techniques. Her contributions are paving the way for advancements in scientific exploration and analysis.