Chengdu, China

Anhua Shi


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Anhua Shi: Innovator in Thermogram Image Processing

Introduction

Anhua Shi is a notable inventor based in Chengdu, China. He has made significant contributions to the field of thermogram image processing. His innovative approach focuses on improving the accuracy of defect image separation through advanced classification techniques.

Latest Patents

Anhua Shi holds a patent titled "Method for separating out a defect image from a thermogram sequence based on weighted naive Bayesian classifier and dynamic multi-objective optimization." This invention provides a method for extracting defect images from thermogram sequences by utilizing a weighted naive Bayesian classifier. The method enhances the classification of thermal response types (TTRs) by analyzing their physical quantities and categorizing them into K groups based on their feature vectors. This approach not only improves the rationality of TTR classification but also increases the accuracy of defect image separation. The dynamic multi-objective optimization aspect of the invention ensures that the selected representative TTRs accurately describe defect outlines while minimizing time consumption.

Career Highlights

Anhua Shi is affiliated with the University of Electronic Science and Technology of China. His work at the university has allowed him to engage in cutting-edge research and development in the field of image processing and optimization techniques. His contributions have been instrumental in advancing the understanding and application of thermogram analysis.

Collaborations

Anhua Shi has collaborated with notable colleagues, including Chun Yin and Yuhua Cheng. Their combined expertise has fostered a productive research environment, leading to innovative solutions in their respective fields.

Conclusion

Anhua Shi's work exemplifies the intersection of innovation and practical application in thermogram image processing. His patented methods significantly enhance the accuracy and efficiency of defect image separation, showcasing his valuable contributions to the field.

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