Andrew J Gardner

Title: Andrew J Gardner: Innovator in Reflectometry Technology

Introduction

Andrew J Gardner is a notable inventor based in Marina Del Rey, CA (US). He has made significant contributions to the field of reflectometry, particularly through his innovative patent that enhances the measurement of reflectance parameters.

Latest Patents

Andrew holds a patent for a "Reflectometry apparatus and method." This invention allows for the independent and reliable measurement of diffuse and specular reflectance parameters of an object. The method estimates variations in surface normal and surface height by utilizing an extended light source, such as a linear cylindrical light source, which is moved across the object's surface. A digital camera captures the reflected light, acquiring a series of images. The observed reflectances are then compared to a synthesized reflectance trace table to determine the parameters that best match the observed data. This patent showcases Andrew's innovative approach to reflectometry, with a total of 1 patent to his name.

Career Highlights

Andrew is affiliated with the University of Southern California, where he continues to advance his research and development in reflectometry technology. His work has implications for various applications, enhancing the accuracy of measurements in different fields.

Collaborations

Andrew has collaborated with esteemed colleagues, including Paul E Debevec and Timothy S Hawkins. Their combined expertise contributes to the advancement of technology in reflectometry and related areas.

Conclusion

Andrew J Gardner is a pioneering inventor whose work in reflectometry has the potential to transform measurement techniques. His innovative patent reflects his commitment to advancing technology in this field.