Company Filing History:
Years Active: 2012-2014
Title: The Innovations of Andreas Schicht
Introduction
Andreas Schicht is a notable inventor based in Erlangen, Germany. He has made significant contributions to the field of network analysis and measurement technologies. With a total of 2 patents, his work has advanced the understanding and application of electromagnetic wave measurements.
Latest Patents
One of his latest patents is a network analyzer with an n-port network designed for measuring the wave parameters of a measurement object. This innovative device includes two ports that receive radio-frequency signals from a signal source. The reflected and transmitted signal components are measured simultaneously, allowing for precise analysis of the measurement object. Another significant patent involves a method for determining the layer thickness of a thermal barrier coating (TBC) on blades of non-positive-displacement machines. This method utilizes electromagnetic waves to assess the coating's thickness by comparing the phases of emitted and reflected waves.
Career Highlights
Andreas Schicht has worked with prominent companies such as Siemens Aktiengesellschaft, where he contributed to various technological advancements. His experience in these organizations has enriched his expertise in the field of measurement technologies.
Collaborations
Throughout his career, Schicht has collaborated with notable colleagues, including Thomas Bosselmann and Klaus Huber. These partnerships have fostered innovation and the development of new technologies in their respective fields.
Conclusion
Andreas Schicht's contributions to the field of network analysis and measurement technologies highlight his role as a significant inventor. His patents and collaborations reflect a commitment to advancing technology and improving measurement techniques.