Magdeburg, Germany

André Mewes

This inventor holds 1 USPTO granted patent. Top assignee: Otto-Von-Guericke-Universitaet Magdeburg. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: André Mewes. Retrieved from https://idiyas.com/inventor/andré-mewes

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: André Mewes and His Work in Medical X-Ray Imaging.

Introduction

André Mewes is an inventor associated with Otto von Guericke University Magdeburg in Magdeburg, Germany. His patent work concerns medical X-ray imaging and the acquisition of projection images for reconstructing computed-tomography images.

Latest Patents

Mewes is credited with 1 patent: “Method and Apparatus for Determining an X-Ray Image Dataset.” The invention describes capturing projection images of a target region using an X-ray detector and reconstructing an X-ray image dataset from those images. A collimator assembly directs X-ray radiation toward the target region through at least one main radiation opening. The patent also covers an apparatus for carrying out this imaging method.

Career Highlights

The patent reflects Mewes’s contribution to techniques for acquiring projection data in medical X-ray imaging, particularly for reconstructing two-dimensional computed-tomography images. His listed institutional affiliation is Otto von Guericke University Magdeburg.

Collaborations

Thomas Hoffmann and Tim Pfeiffer are identified as Mewes’s coworkers. Their names are associated with his professional context, though the supplied information does not specify their roles in the patent.

Conclusion

André Mewes’s patent focuses on collimated X-ray image acquisition and reconstruction, contributing to the development of medical imaging methods at Otto von Guericke University Magdeburg.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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