Burke, VA, United States of America

Alok K Berry


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Alok K Berry: Innovator in Semiconductor Measurement Technology

Introduction

Alok K Berry is a notable inventor based in Burke, Virginia, who has made significant contributions to the field of semiconductor technology. His innovative work focuses on non-destructive measurement techniques that enhance the understanding of semiconductor materials.

Latest Patents

Alok K Berry holds a patent for a "Method and apparatus for non-destructively measuring local resistivity." This invention involves an apparatus designed to measure the resistivity of semiconductors, such as Indium Phosphide (InP). The apparatus utilizes light sources to illuminate a specific portion of the semiconductor with two distinct light beams, each at a predetermined wavelength. The first light beam excites the semiconductor by photo-injecting carriers, while the second light beam bombards the local area with a specific photon energy. The apparatus measures the fractional change in reflectance of the second light beam in response to the first light beam. This data is recorded for various photon energy values, generating a photoreflectance line-shape. The resulting line-shape phase angle is then used to determine the resistivity of the semiconductor.

Career Highlights

Alok K Berry is currently employed at the United States Navy, where he applies his expertise in semiconductor technology. His work has been instrumental in advancing measurement techniques that are crucial for the development and application of semiconductor materials.

Collaborations

Throughout his career, Alok has collaborated with notable colleagues, including D Kurt Gaskill and Nicholas Bottka. These collaborations have contributed to the advancement of research and innovation in the field of semiconductor measurement.

Conclusion

Alok K Berry's contributions to semiconductor technology through his innovative patent demonstrate his commitment to advancing measurement techniques. His work not only enhances the understanding of semiconductor materials but also paves the way for future innovations in the field.

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