Leuven, Belgium

Alessandra Leonhardt


 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Alessandra Leonhardt: Innovator in Semiconductor Materials

Introduction

Alessandra Leonhardt is a distinguished inventor based in Leuven, Belgium. She has made significant contributions to the field of semiconductor technology, particularly in the measurement and analysis of two-dimensional (2D) semiconductor materials. With one patent to her name, she stands out as an important figure in her domain.

Latest Patents

Alessandra holds a patent titled "Method for measuring the trap density in a 2-dimensional semiconductor material." This innovative method involves irradiating a spot on a layer of 2D semiconductor material deposited on a substrate to generate excitons, which leads to the emission of photons. The resulting photoluminescence spectrum is meticulously recorded for various charge carrier concentrations within the layer. By modulating the light source's output power, the charge carrier concentration can be varied, thereby allowing the relationship between photoluminescence intensity and carrier concentration to be analyzed. This research culminates in the derivation of trap density within the bandgap, providing valuable insights into the materials' properties.

Career Highlights

Alessandra has a notable professional background, having worked with prominent institutions such as Imec Vzw and Katholieke Universiteit. Her research and contributions have placed her at the forefront of semiconductor innovation, enhancing the understanding of materials that are crucial for modern electronics.

Collaborations

Throughout her career, Alessandra has collaborated with esteemed colleagues, including Cesar Javier Lockhart De La Rosa and Stefan De Gendt. These collaborations have enriched her work and expanded the impact of her research in semiconductor technologies.

Conclusion

Alessandra Leonhardt's contributions to the semiconductor field, particularly through her patented method for measuring trap density in 2D materials, highlight her innovative spirit and commitment to advancing technology. Her work not only propels her career forward but also facilitates significant advancements within the broader scientific community.

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