Alan M Offt

Title: Alan M Offt: Innovator in Measurement Technology

Introduction

Alan M Offt is a notable inventor based in Clifton Park, NY (US). He has made significant contributions to the field of measurement technology, holding 2 patents that showcase his innovative approach to solving complex problems.

Latest Patents

One of his latest patents is a method and apparatus for determining the position of a feature of an object. This system includes a spot projector that projects a spot in the vicinity of the feature and an imaging device with a limited field of view. The precision of the spot projector allows for accurate location determination when the spot and the feature are within the imaging device's field of view. Additionally, provisions are made for determining depth or relief information about the object. Another significant patent is the machine vision differential measurement system. This system determines the thickness of an object with two surfaces by forming two geometric images on the surfaces in a superimposed relationship. The images are captured by two video cameras, and their relative positions are used to measure the object's thickness.

Career Highlights

Alan M Offt has been associated with Mechanical Technology Incorporated, where he has applied his expertise in measurement technology. His work has contributed to advancements in the field, enhancing the capabilities of measurement systems.

Collaborations

Throughout his career, Alan has collaborated with notable colleagues, including Robert L Jackson, Jr and Russell P Kraft. These collaborations have fostered innovation and development in their respective projects.

Conclusion

Alan M Offt's contributions to measurement technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the industry positively.