Yokohama, Japan

Akihisa Saito



Average Co-Inventor Count = 3.7

ph-index = 4

Forward Citations = 85(Granted Patents)


Location History:

  • Kanagawa, JP (1994)
  • Kanagawa-ken, JP (2002)
  • Kamakura, JP (2002 - 2003)
  • Yokohama, JP (1989 - 2019)

Company Filing History:


Years Active: 1989-2019

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11 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Akihisa Saito

Introduction

Akihisa Saito is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of radiation detection technology, holding a total of 11 patents. His work focuses on the development of advanced scintillator materials and devices that enhance the performance of radiation detectors.

Latest Patents

Among his latest patents is the invention of a ceramic scintillator array, which includes a plurality of scintillator segments composed of a sintered compact of a rare earth oxysulfide phosphor. This innovative design features a reflective layer interposed between adjacent scintillator segments, containing a transparent resin and reflective particles. The reflective particles are made from titanium oxide and various inorganic substances, ensuring optimal performance. Another notable patent involves a scintillator that suppresses a decrease in optical output, utilizing a sintered body of rare earth oxysulfide with specific structural characteristics.

Career Highlights

Throughout his career, Akihisa Saito has worked with notable companies such as Toshiba Corporation and Toshiba Materials Co., Ltd. His experience in these organizations has allowed him to develop cutting-edge technologies in the field of radiation detection.

Collaborations

He has collaborated with esteemed colleagues, including Eiji Oyaizu and Kazumitsu Morimoto, contributing to the advancement of innovative solutions in his field.

Conclusion

Akihisa Saito's contributions to the field of radiation detection through his patents and collaborations highlight his role as a leading inventor. His work continues to influence advancements in technology and improve the efficiency of radiation inspection devices.

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