Company Filing History:
1 out of 1,100 
1 out of 2 Years Active: 1990
Title: Akeo Kimura: Innovator in Low-Temperature Testing of IC Devices
Introduction
Akeo Kimura is a notable inventor based in Iruma, Japan. He has made significant contributions to the field of integrated circuit (IC) device testing, particularly at low temperatures. His innovative approach has led to the development of specialized apparatuses that enhance the performance testing of IC devices.
Latest Patents
Akeo Kimura holds a patent for an "Apparatus for testing IC devices at low temperature and cooling bag." This invention includes a cooling disk designed to be cooled with liquid nitrogen or similar refrigerants, which allows for effective cooling of IC devices in contact or proximity. Additionally, his cooling bag is specifically designed to intimately contact the IC device while enclosing a refrigerant. Another apparatus he developed features a cooling bag reeved around a drive roller and an idler roller, functioning as a belt conveyor to cool IC devices during transportation.
Career Highlights
Throughout his career, Akeo Kimura has worked with prominent companies such as Kabushiki Kaisha Kobe Seiko Sho and Japan LSI Co., Ltd. His experience in these organizations has contributed to his expertise in the field of IC device testing.
Collaborations
Akeo Kimura has collaborated with notable individuals in his field, including Osamu Morioka and Keizo Tokushige. These partnerships have likely fostered innovation and advancements in low-temperature testing technologies.
Conclusion
Akeo Kimura's contributions to the testing of IC devices at low temperatures highlight his innovative spirit and dedication to enhancing technology. His patented inventions serve as a testament to his expertise and impact in the field.