Company Filing History:
Years Active: 2003
Title: Adam Rhoads - Innovator in Defect Detection Technology
Introduction
Adam Rhoads is a notable inventor based in San Ramon, CA (US). He has made significant contributions to the field of defect detection technology, particularly in the inspection of patterned substrates. His innovative approach has led to the development of methods and apparatus that enhance the accuracy and efficiency of defect detection processes.
Latest Patents
Adam Rhoads holds 1 patent for his invention titled "Feature-based defect detection." This patent outlines methods and apparatus for inspecting a patterned substrate. The process involves preparing a reference image and a test image, extracting features from both images, and matching these features to identify defects. The invention also includes apparatus for inspecting patterned substrates and computer-readable media containing instructions for controlling a system designed for this purpose. The images utilized in this process can be electron-beam voltage-contrast images.
Career Highlights
Adam Rhoads is currently employed at Applied Materials, Inc., a leading company in the field of materials engineering. His work focuses on advancing technologies that improve the inspection and manufacturing processes in various industries. His expertise in defect detection has positioned him as a valuable asset to his team and the company.
Collaborations
Adam has collaborated with notable colleagues such as Harry S Gallarda and Chiwoei Wayne Lo. These collaborations have contributed to the development of innovative solutions in the field of defect detection.
Conclusion
In summary, Adam Rhoads is a distinguished inventor whose work in feature-based defect detection has made a significant impact in the industry. His contributions continue to drive advancements in technology and improve inspection processes.