Dresden, Germany

Adam Michal Urbanowicz

USPTO Granted Patents = 1 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Innovations by Adam Michal Urbanowicz in Semiconductor Technology

Introduction

Adam Michal Urbanowicz is an accomplished inventor based in Dresden, Germany. He has worked diligently in the field of semiconductor technology and has made a significant impact with his innovative ideas. With one patent to his name, Urbanowicz continues to contribute to advancements in this critical industry.

Latest Patents

Urbanowicz's notable patent is titled “Detection of Particle Contamination on Wafers.” This invention addresses the pressing issue of ensuring the integrity of semiconductor wafers. The method involves examining a specific area of the wafer using a metrology system. By employing scatterometry or ellipsometry/reflectometry tools, Urbanowicz’s invention enables the collection of measured metrology data. The data is then compared with reference metrology data to determine the presence of particle contamination in the examined area. This innovative approach is crucial in maintaining high standards in semiconductor manufacturing.

Career Highlights

Adam Michal Urbanowicz has established himself as a vital asset in his role at GlobalFoundries Inc., a leading company in semiconductor technology. His work focuses on improving the quality and reliability of semiconductor processes, ensuring that innovations continue to thrive in the dynamically evolving tech landscape.

Collaborations

Throughout his career, Urbanowicz has collaborated with talented professionals like Carsten Hartig and Daniel Fischer. These collaborations have fostered an environment of creativity and innovation, enabling the team to tackle complex challenges in the semiconductor industry effectively.

Conclusion

In summary, Adam Michal Urbanowicz serves as a key player in the world of semiconductor technology through his innovative patent and collaboration with esteemed colleagues. His dedication to advancing detection methods for particle contamination on wafers is instrumental in furthering the capabilities of semiconductor manufacturing, ensuring higher standards and reliability in the tech industry.

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