Laval, Canada

Émile Ducrocq

This inventor holds 1 USPTO granted patent. Top assignee: Matrox Electronic Systems Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Émile Ducrocq. Retrieved from https://idiyas.com/inventor/émile-ducrocq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Émile Ducrocq: Innovator in Object Contour Comparison

Introduction

Émile Ducrocq is a notable inventor based in Laval, Canada. He has made significant contributions to the field of object contour comparison through his innovative methods and systems. His work is particularly relevant in areas requiring precise shape analysis and comparison.

Latest Patents

Ducrocq holds a patent for a "Method and system for comparison of object contours." This patent describes a method and system for comparing the contours of objects. It involves determining a first tree structure that connects all points of a set of points, ensuring that the length of this structure is minimized. The process includes identifying a subset of points that represent the contour of a first object and comparing it with a second object based on shape characteristics. This innovative approach allows for a more efficient and accurate comparison of object shapes.

Career Highlights

Émile Ducrocq is associated with Matrox Electronic Systems Ltd., where he applies his expertise in developing advanced technologies. His work at Matrox has contributed to the company's reputation for innovation in imaging and video processing solutions. Ducrocq's patent reflects his commitment to enhancing object recognition and analysis through technological advancements.

Collaborations

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Conclusion

Émile Ducrocq's contributions to the field of object contour comparison exemplify the impact of innovative thinking in technology. His patent showcases a method that enhances the accuracy of shape analysis, marking him as a significant figure in his field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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