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For the Inventor, By the Inventor

Seoul, South Korea

Nictech Co., Ltd.


USPTO Granted Patents = 1

Forward Citations = 2

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2 inventors (with patents filed for the assignee):

goldMedal Byung-hee Jeon (1 out of 3 patents)

silverMedal Dae-Cheol Kang (1 out of 1 patent)


1 patent:

1. 7619430 - Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes (2009-11-17),
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USPTO Data Jan 1 1976 - Jan 13 2026

1 Patents

#1,769 in Seoul

#5,526 in South Korea

...
Seoul, South Korea

Nictech Co., Ltd.

Forward Citations = 2

2 inventors:

goldMedal Byung-hee Jeon (1 out of 3 patents)

silverMedal Dae-Cheol Kang (1 out of 1 patent)

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