The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 23, 2024
Filed:
Jul. 17, 2019
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Fang Dong, Shanghai, CN;
Leander Dietzsch, Jena, DE;
Qi Cao, Shanghai, CN;
Jochen Ingo Schweizer, Fürstenfeldbruck, DE;
Ilka Schlesiger, Jena, DE;
Jacquelyn Schmelter, Weimar, DE;
Martin Stohr, Jena, DE;
Michael Winterot, Jena, DE;
Qiong Zhang, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
U.S. Cl.
CPC ...
Dong, Fang. (2024). Microscope (U.S. Patent No. D1024157). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/D1024157
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile