The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Mar. 06, 2017
Applicant:

D3 Semiconductor Llc, Addison, TX (US);

Inventor:

Thomas E. Harrington, III, Carrollton, TX (US);

Assignee:

D3 Semiconductor LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/525 (2006.01); H01L 27/088 (2006.01); H01L 29/78 (2006.01); H01L 27/06 (2006.01); H01L 49/02 (2006.01); H01L 29/739 (2006.01); H01L 27/112 (2006.01); H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
H01L 23/5256 (2013.01); H01L 22/20 (2013.01); H01L 23/5258 (2013.01); H01L 27/0629 (2013.01); H01L 27/088 (2013.01); H01L 27/11206 (2013.01); H01L 28/20 (2013.01); H01L 29/7395 (2013.01); H01L 29/7802 (2013.01); H01L 29/7827 (2013.01);
Abstract

Improvement of key electrical specifications of vertical semiconductor devices, usually found in the class of devices known as discrete semiconductors, has a direct impact on the performance achievement and power efficiency of the systems in which these devices are used. Imprecise vertical device specifications cause system builders to either screen incoming devices for their required specification targets or to design their system with lower performance or lower efficiency than desired. Disclosed is an architecture and method for achieving a desired target specification for a vertical semiconductor device. Precise trimming of threshold voltage improves targeting of both on-resistance and switching time. Precise trimming of gate resistance also improves targeting of switching time. Precise trimming of a device's effective width improves targeting of both on-resistance and current-carrying capability. Device parametrics are trimmed to improve a single device, or a parametric specification is targeted to match specifications on two or more devices.


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