The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 12, 2018

Filed:

Jan. 11, 2016
Applicant:

Carl Zeiss Smt Gmbh, Oberkochen, DE;

Inventors:

Rolf Freimann, Aalen, DE;

Ulrich Wegmann, Koenigsbronn, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/42 (2006.01); G03F 7/20 (2006.01); G01B 9/02 (2006.01); G01B 11/00 (2006.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70491 (2013.01); G01B 9/0209 (2013.01); G01B 9/02018 (2013.01); G01B 9/02028 (2013.01); G01B 9/02065 (2013.01); G01B 11/002 (2013.01); G01N 21/95607 (2013.01); G03F 7/70 (2013.01); G03F 7/706 (2013.01); G03F 7/7085 (2013.01); G03F 7/70258 (2013.01); G01N 2021/95615 (2013.01); G01N 2021/95676 (2013.01);
Abstract

An optical imaging device, including an imaging unit and a measuring device. The imaging unit includes a first optical element group having at least one first optical element, which contributes to the imaging. The measuring device determines an imaging error, which occurs during the imaging, using a capturing signal. The measuring device includes a measurement light source, a second optical element group and a capturing unit. The measurement light source emits at least one measurement light bundle, The second optical element group includes an optical reference element and a second optical element, which guide the measurement light bundle onto the capturing unit, to generate the capturing signal. Each second optical element has a defined spatial relationship with a respective one of the first optical elements, The second optical elements differ from the first optical elements. The measuring device determines the imaging error with the capturing signal.


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