The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 05, 2018

Filed:

Nov. 18, 2014
Applicant:

Powdec K.k., Oyama-shi, Tochigi, JP;

Inventors:

Shoko Echigoya, Oyama, JP;

Fumihiko Nakamura, Oyama, JP;

Shuichi Yagi, Oyama, JP;

Souta Matsumoto, Oyama, JP;

Hiroji Kawai, Oyama, JP;

Assignee:

POWDEC K.K., Tochigi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/15 (2006.01); H01L 29/06 (2006.01); H01L 29/861 (2006.01); H01L 29/778 (2006.01); H01L 29/872 (2006.01); H01L 29/205 (2006.01); H01L 29/207 (2006.01); H01L 29/739 (2006.01); H01L 29/417 (2006.01); H01L 29/423 (2006.01); H01L 29/10 (2006.01); H01L 29/20 (2006.01);
U.S. Cl.
CPC ...
H01L 29/0634 (2013.01); H01L 29/063 (2013.01); H01L 29/0619 (2013.01); H01L 29/205 (2013.01); H01L 29/207 (2013.01); H01L 29/7393 (2013.01); H01L 29/7783 (2013.01); H01L 29/7786 (2013.01); H01L 29/861 (2013.01); H01L 29/872 (2013.01); H01L 29/0657 (2013.01); H01L 29/1066 (2013.01); H01L 29/2003 (2013.01); H01L 29/41758 (2013.01); H01L 29/42316 (2013.01); H01L 2224/81 (2013.01); H01L 2224/85 (2013.01);
Abstract

Provided are a semiconductor device and a bidirectional field effect transistor which can easily overcome the tradeoff relation between the high voltage resistance and high speed in the semiconductor device using a polarization super junction, realize both the high voltage resistance and elimination of the occurrence of current collapse, operate at a high speed, and further the loss is low. The semiconductor device comprises a polarization super junction region and a p-electrode contact region. The polarization super junction region comprises an undoped GaN layer, an undoped AlGaN layerwith a thickness not smaller than 25 nm and not larger than 47 nm and 0.17≤x≤0.35, an undoped GaN layerand a p-type GaN layer. When the reduced thickness tR is defined as tR=u+v(1+w×10) for the thickness u [nm] of the undoped GaN layer, the thickness v [nm] and the Mg concentration w [cm] of the p-type GaN layer, tR≥0.864/(x−0.134)+46.0 [nm] is satisfied. The p-electrode contact region comprises a p-type GaN contact layer formed to be in contact with the p-type GaN layerand a p-electrode that is in contact with the p-type GaN contact layer.


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