The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Oct. 19, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Ingo Mueller, Aalen, DE;
Nicole Rauwolf, Deiningen, DE;
Christof Riedesel, Essingen, DE;
Thomas Kemen, Aalen, DE;
Joerg Jacobi, Aalen, DE;
Arne Thoma, Aalen, DE;
Markus Doering, Heidelberg, DE;
Dirk Zeidler, Oberkochen, DE;
Juergen Kynast, Jena, DE;
Gerd Benner, Aalen, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
A method for operating a multi-beam particle optical unit comprises includes providing a first setting of effects of particle-optical components, wherein a particle-optical imaging is characterizable by at least two parameters. The method also includes determining a matrix A, and determining a matrix S. The method further includes defining values of parameters which characterize a desired imaging, and providing a second setting of the effects of the components in such a way that the particle-optical imaging is characterizable by the parameters having the defined values.