The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Jun. 29, 2016
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Thomas Engel, Aalen, DE;
Nils Haverkamp, Aalen, DE;
Michael Wick, Munich, DE;
Hans-Joachim Frasch, Aalen, DE;
CARL ZEISS INDUSTRIELLE MESSTECHNIK GMBH, Oberkochen, DE;
Abstract
The present invention relates to a method for simulating an image recording by an optical sensor of a coordinate measuring machine for inspecting a measurement object, comprising the following steps: providing a first data set representing a model of the measurement object, a second data set representing a model of an illumination of the measurement object, and a third data set representing a model of an optics of the optical sensor, and rendering an image stack on the basis of the first data set, the second data set and the third data set, wherein the image stack has a plurality of virtual images of at least one partial region of the measurement object, wherein each virtual image is rendered at least with a different second and/or different third data set. Furthermore, the present invention relates to a method for optimizing an image recording by a coordinate measuring machine.