The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Feb. 27, 2017
Carl Zeiss Microscopy Gmbh, Jena, DE;
Wolfgang Bathe, Jena, DE;
Ralf Netz, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
An optical microscope having a sample plane for positioning a sample, and a light source for emitting illumination light, includes optical imaging means for guiding the illumination light into the sample plane. A detector device having a plurality of detector elements for detecting sample light coming from the sample. Adjacent detector elements are at a distance from one another which is smaller than an Airy-Disk produced by a point of the sample plane on the detector device. A scanning device has at least a first and a second optical arrangement simultaneously movable in a common direction for producing an illumination scanning movement and a detection scanning movement, which are opposite to one another. Sample regions spaced apart from one another can be examined simultaneously, such that both a beam path of the sample light from the sample plane to the detector device and a beam path of the illumination light from the light source to the sample plane run via the first optical arrangement and only one of these two beam paths runs via the second optical arrangement.