The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 05, 2018
Filed:
Apr. 08, 2016
Rigaku Corporation, Tokyo, JP;
Motoyuki Yamagami, Takatsuki, JP;
Hiroyuki Kawakami, Takatsuki, JP;
Rigaku Corporation, Tokyo, JP;
Abstract
An X-ray fluorescence analyzing system includes: a cassette () in which a substrate () is housed; a vapor phase decomposing device () for dissolving and then drying a measurement object () on a sample substrate surface () to be held thereon; at least one measurement substrate (); a sample recovering device () for dripping and drying a recovery liquid (), which has recovered the measurement object () from the sample substrate (), onto a predetermined dripping position on a measurement substrate surface () to hold the recovery liquid () thereon; an X-ray fluorescence spectrometer (); a conveying device () for conveying the substrate (); and a control device () for controlling the devices (). The recovery liquids () of the measurement objects () from a plurality of the sample substrates () are dripped and dried on the single measurement substrate surface () to be measured.