The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Sep. 22, 2014
Applicant:

Anapass Inc., Seoul, KR;

Inventors:

Daehyun Kim, Seoul, KR;

Tae Jin Kim, Seoul, KR;

Jae Hun Lee, Seoul, KR;

Assignee:

ANAPASS INC., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/14 (2014.01); H04N 19/105 (2014.01); H04N 19/176 (2014.01); H04N 19/182 (2014.01); H04N 19/54 (2014.01); H04N 19/567 (2014.01);
U.S. Cl.
CPC ...
H04N 19/105 (2014.11); H04N 19/14 (2014.11); H04N 19/176 (2014.11); H04N 19/182 (2014.11); H04N 19/54 (2014.11); H04N 19/567 (2014.11);
Abstract

Provided are a method for motion estimation and an apparatus for processing an image. The method includes extracting a pattern from any one frame, classifying the extracted pattern as any one of predetermined basic patterns, counting basic patterns of regions included in macroblocks according to types of the basic patterns to set representative basic patterns of the macroblocks, calculating at least one of a sum of absolute difference (SAD) term coefficient and a smoothness constraint (SC) term coefficient from a correlation between representative basic patterns of macroblocks included in a macroblock group, and calculating a cost function result using at least one of the calculated SAD term coefficient and SC term coefficient.


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