The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Feb. 23, 2016
Applicant:
Protochips, Inc., Morrisville, NC (US);
Inventors:
John Damiano, Jr., Apex, NC (US);
Stephen E. Mick, Weimar, TX (US);
David P. Nackashi, Raleigh, NC (US);
Assignee:
Protochips, Inc., Raleigh, NC (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
H01J 37/20 (2013.01); H01J 37/26 (2013.01); H01J 37/261 (2013.01); H01J 2237/188 (2013.01); H01J 2237/2001 (2013.01); H01J 2237/2002 (2013.01); H01J 2237/2003 (2013.01); H01J 2237/2007 (2013.01); H01J 2237/2008 (2013.01); H01J 2237/2602 (2013.01); H01J 2237/28 (2013.01); H01J 2237/2802 (2013.01);
Abstract
Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.