The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Mar. 28, 2017
Applicant:

Macronix International Co., Ltd., Hsinchu, TW;

Inventors:

Yuchih Yeh, Hsin-Chu, TW;

Yi-Chun Liu, Hsin-Chu, TW;

Naiping Kuo, Hsin-Chu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/26 (2006.01); G11C 16/34 (2006.01); G11C 16/04 (2006.01); G11C 16/10 (2006.01); G11C 16/16 (2006.01); G11C 29/50 (2006.01); H03M 13/05 (2006.01);
U.S. Cl.
CPC ...
G11C 16/3427 (2013.01); G11C 16/0483 (2013.01); G11C 16/10 (2013.01); G11C 16/16 (2013.01); G11C 16/26 (2013.01); G11C 16/3495 (2013.01); G11C 29/50004 (2013.01); G11C 29/50016 (2013.01); H03M 13/05 (2013.01); G11C 2029/5004 (2013.01);
Abstract

Systems, methods, and apparatus including computer-readable mediums for detecting data integrity, e.g., read disturbance and/or data retention, of memory systems such as NAND flash memory devices are provided. For detection of read disturbance, an indicator string in a block of a memory can be filled with a predetermined state and read with a special read condition to check read disturbance of the block in one read operation. For detection of data retention, a page of a dedicated block in a memory can be chosen as an indicator page. The indicator page can be filled with a predetermined pattern and read with a proper voltage to quantify a retention shift and further to evaluate other data blocks in the memory with the qualified retention shift. The techniques enable a quick method to examine memory and help to refresh memory before data corruption.


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