The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
May. 19, 2016
Daqri, Llc, Los Angeles, CA (US);
Brian Mullins, Altadena, CA (US);
Matthew Kammerait, Studio City, CA (US);
Mark Anthony Sararu, Los Angeles, CA (US);
Micron Technology, Inc., Boise, ID (US);
Abstract
A system and method for measuring depth using an optical radar system are described. The system includes an optical radar, a camera, a display, and a processor. The optical radar emits a signal towards an object. The processor identifies an object depicted in an image captured with the camera. The processor generates the signal with a non-repeating pattern of amplitude and frequency, and computes a depth of the object based on a difference in phase angle between the signal emitted from the optical radar and a return signal received at the optical radar. The depth includes a distance between the optical radar and the object. The processor generates AR content based on the identified object and adjusts a characteristic of the AR content in the display based on the computed depth of the object.