The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Oct. 13, 2014
Applicant:

Parade Technologies, Ltd., Santa Clara, CA (US);

Inventors:

Han Wang, Shanghai, CN;

Petro Ksondzyk, Seattle, WA (US);

Leilei Chen, Shanghai, CN;

Assignee:

PARADE TECHNOLOGIES, LTD., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); G06F 3/041 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); G06F 3/0418 (2013.01); G06F 2203/04108 (2013.01); G06F 2203/04112 (2013.01);
Abstract

A method is disclosed for determining detecting a conductive object and determining the type of object and the type of contact that object has with a touch sensitive surface, the method comprising measuring capacitance on a plurality of mutual capacitance sensors, each mutual capacitance sensor corresponding to a unit cell in an array of unit cells. After mutual capacitance is measured a peak unit cell is identified based on the measured capacitances and a matrix sum of a plurality of unit cells surround the peak unit cell is calculated. The value of the peak unit cell and the matrix sum are then compared to a range and a contact type determined based on the comparison.


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