The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 29, 2018
Filed:
Oct. 16, 2014
Tokyo Seimitsu Co., Ltd, Tokyo, JP;
Yuichi Ozawa, Tokyo, JP;
Yasuhito Iguchi, Tokyo, JP;
Tetsuo Yoshida, Tokyo, JP;
Junzo Koshio, Tokyo, JP;
Tokyo Seimitsu Co. LTD, Tokyo, JP;
Abstract
To provide a probing device and a probing method for an electronic device capable of confirming whether or not an electrical inspection has been executed appropriately, with an electrode pad being made in contact with a probe with a predetermined pressure, by utilizing a change in external shapes to be formed on the electrode pad when the probe and the electrode pad are pressed onto each other. The device is provided with a microscopefor image-capturing the electrode pad and for outputting the external shape of the electrode pad as image data, and a control unitwhich stores image data of an external shape of the electrode pad prior to the contact with a probe, and compares the image data of the external shape thus stored with image data thereof after the contact obtained from the microscope, or compares the registered frame of the electrode pad with the outer periphery of the electrode pad detected at the time of inspecting a needle trace, so that the quality of the contact between the electrode pad and the probeis determined.