The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Sep. 04, 2015
Applicant:

Keithley Instruments, Llc, Solon, OH (US);

Inventors:

Wayne C. Goeke, Hudson, OH (US);

Gregory Sobolewski, Brecksville, OH (US);

Assignee:

Keithley Instruments, LLC, Solon, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); G01R 31/00 (2006.01); G01R 1/04 (2006.01); G01R 31/28 (2006.01); G01R 27/28 (2006.01); G01R 31/24 (2006.01); G01R 31/06 (2006.01); G01R 31/18 (2006.01); G01R 31/26 (2014.01);
U.S. Cl.
CPC ...
G01R 1/0416 (2013.01); G01R 27/28 (2013.01); G01R 31/24 (2013.01); G01R 31/2822 (2013.01); G01R 31/2889 (2013.01); G01R 31/06 (2013.01); G01R 31/18 (2013.01); G01R 31/2607 (2013.01);
Abstract

Embodiments of the present invention provide an improved two-cable connection system for connecting electrical test instrumentation to a device under test (DUT). In one embodiment, a single pair of equal-length triaxial cables each has a desired characteristic impedance. Each cable has a center connecter, intermediate conductor, and outer conductor. The proximal end of each cable is connected to the test instrumentation, and the distal ends are located at the DUT. At the distal end, the center conductors are connected to the DUT, the intermediate conductors are allowed to float, and the outer conductors are connected to each other. The proximal end of each cable is connected to the device using an appropriate connection for the test that will be performed. This allows the test instrumentation to perform different types of tests without changing connections to the DUT.


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