The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2018

Filed:

Nov. 28, 2016
Applicant:

Cymer, Llc, San Diego, CA (US);

Inventor:

Zhongquan Zhao, San Diego, CA (US);

Assignee:

Cymer, LLC, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01D 18/00 (2006.01); G01J 3/50 (2006.01); G01N 21/31 (2006.01); G01N 21/33 (2006.01); G03F 7/20 (2006.01);
U.S. Cl.
CPC ...
G01J 3/50 (2013.01); G01N 21/3103 (2013.01); G01N 21/33 (2013.01); G03F 7/7055 (2013.01); G03F 7/70575 (2013.01);
Abstract

An apparatus includes a material having an optical transition profile with a known energy transition; and a detector configured to detect a characteristic associated with the interaction between the material and the testing light beam. The testing light beam is either a primary light beam produced by an optical source or a calibration light beam. The apparatus also includes a spectral analysis module placed in a path of the primary light beam; and a control system connected to the detector and to the spectral detection system. The control system is configured to determine a reference spectral profile of the primary light beam based on the detected characteristic; compare the reference spectral profile of the primary light beam with a sensed spectral profile of the primary light beam output from the spectral detection system; and based on this comparison, adjust a scale of the spectral detection system.


Find Patent Forward Citations

Zhao, Zhongquan. (2018). Calibration of a spectral analysis module (U.S. Patent No. 9983060). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9983060

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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