The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2018

Filed:

Dec. 23, 2015
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Sundeep Raniwala, Folsom, CA (US);

Bidhan P. Chaudhuri, Santa Clara, CA (US);

Anders Grunnet-Jepsen, San Jose, CA (US);

Assignee:

INTEL CORPORATION, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); H04N 13/02 (2006.01); H01S 5/183 (2006.01);
U.S. Cl.
CPC ...
G06T 7/002 (2013.01); G06T 7/0057 (2013.01); H01S 5/183 (2013.01); H04N 13/025 (2013.01); H04N 2213/003 (2013.01);
Abstract

A method and apparatus for performing inbuilt calibration of camera system that performs three-dimensional measurements and depth reconstruction are described. In one embodiment, the method includes displaying, using a projector of a capture device, a fiducial projection pattern in response to calibration of the capture device. The method may also include capturing, with a camera of the capture, an image of the fiducial projection pattern. The method may also include determining calibration coefficient values indicative of relative physical relationships of one or more components of the depth camera system based on analysis of the captured image of the fiducial projection pattern.


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