The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2018
Filed:
Jul. 18, 2017
Sift Science, Inc., San Francisco, CA (US);
Fred Sadaghiani, San Francisco, CA (US);
Alex Paino, San Francisco, CA (US);
Jacob Burnim, San Francisco, CA (US);
Keren Gu, San Francisco, CA (US);
Gary Lee, San Francisco, CA (US);
Noah Grant, San Francisco, CA (US);
Eugenia Ho, San Francisco, CA (US);
Doug Beeferman, San Francisco, CA (US);
Sift Science, Inc., San Francisco, CA (US);
Abstract
Systems and methods include: collecting digital event data from at least one remote source of digital event data; using the collected digital event data as input into primary machine learning ensemble that predicts the likelihood of digital fraud and/or digital abuse; generating by the machine learning system the global digital threat score; identifying a sub-request for a specific digital threat score for a digital abuse type; in response to identifying the sub-request, providing the input of the collected digital event data to a secondary machine learning model ensemble of the machine learning system that predicts a likelihood of the identified digital abuse type; generating by the secondary machine learning ensemble the specific digital threat score for the digital abuse type based on the input of the collected digital event data; and transmitting the global digital threat score and the specific digital threat score for the identified digital abuse type.